Track and trace systems
VMS Contour Verification

Your Benefits

  • Quick and efficient dimensioning thanks to dynamic inline object measurement
  • Quality inspection of moving cubic objects for all six sides
  • Increased system throughput thanks to non-contact contour verification
  • Range of options: stand-alone solution or in combination with reading station and weighing technology
  • Increased system availability and reduction in operating costs thanks to short MTTR

Overview

The VMS Contour Verification track and trace system is a non-contact dimensioning system for dynamic measurement of objects on conveyor belts. It is able to detect deformations on cubic objects for all six sides, allowing it to prevent problems such as downtime in automated storage facilities. Software developed specifically for the system detects even the tiniest deformations, providing a perfect monitoring tool for goods storage and retrieval processes. The modular system construction ensures compatibility with existing solutions from SICK and enables adaptations to customer-specific applications.

At a glance
  • Measurement accuracy up to 5 mm x 5 mm x 5 mm
  • Maximum object size up to 2.000 mm x 1.000 mm x 1.000 mm
  • Conveying speeds of up to 2.0 m/s
  • Deformations detectable down to 10 mm
  • Output of 3D point cloud data possible
  • Two zones with adjustable tolerance for the degree of deformation

Applications

Technical overview

 
  • Technical data overview

    Technical data overview

    Tasks

    Object measurement (non-contact, dynamic)

    Volume measurement

    Position determination

    Deformation detection

    Transport speedStart-stop operation possible
    Accuracy of object coverage

    Only valid for dimensioning, not for deformation measurements.

    ± 0.2 ″ x ± 0.2 ″ x ± 0.2 ″

    Minimum object size

    200 mm x 100 mm x 100 mm

    8 ″ x 4 ″ x 4 ″

    Maximum object size

    2,000 mm x 1,000 mm x 1,000 mm

    80 ″ x 40 ″ x 40 ″

    Output dataXML, ASCII, customer protocol
All technical data can be found accompanying the individual product

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