SICK AppSpace Artificial Intelligence
Deep Learning

Artificial intelligence for SICK sensors

Your Benefits

Fast, automatic and reliable decision-making by the sensor, even for complex tasks
Reduces your development time and expense: Image analyses are trained using example images
No additional hardware or software required thanks to cloud and on-device training
Fast support with the SICK Support Portal
Training Deep Learning modules does not require that the users have sound knowledge of machine learning
Quickly find out if Deep Learning is suitable for your application using the free trial offer
Easy configuration of the camera with the SICK Intelligent Inspection SensorApp

Overview

Artificial intelligence for SICK sensors

Deep Learning from SICK breaks new ground in industrial automation. Deep Learning is user-friendly and allows SICK sensors to be trained for customer-specific tasks with little effort using sample images. The sensors can then evaluate and sort objects in line with customized criteria on-site – in machines or systems – even if the natural appearance of the objects varies.

At a glance

Interference takes place directly on programmable SICK products
Training of neural networks for classifying images in the SICK cloud
Anomaly detection is trained directly on the device using the Intelligent Inspection SensorApp
Deep Learning is part of the SICK AppSpace eco-system

Artificial Intelligence Teaser Box Image

Industrial Artificial Intelligence

Unlocking the full potential of Intelligent Sensors with deep learning solutions

Learn more

Supported Products

Product families

Products

Applications

Technical overview

Show all

Hide all

Technical data overview

Task	Training of neural networks for classifying images Classification of images using a neural network previously created with the SICK product dStudio Detection of anomalies on objects based on a model previously taught in the sensor itself.
Technology	Classification of images based on artificial neural networks Classification of images and detection of anomalies based on artificial neural networks
Language	English
Supported products	InspectorP series SIM1012 SIM1004 SIM2000 SIM2500 SIM4000 SICK AppEngine
Supported browsers	Google Chrome (version 80 or higher)

Show all

Hide all

All technical data can be found accompanying the individual product

SICK AppSpace Artificial Intelligence Deep Learning