• Robust part inspection of deep blue solar cells on dark backgrounds
• UV illumination and ambient light immunity
• Robust pattern match algorithm to locate part independent of position, rotation and scale
• Multi feature inspections and output by logical expressions
• Storage of up to 16 reference templates
• Exchangeable lens and scratch-resistant front window
• Easy configuration/view in PC and support for post-analysis in emulator

Solar

• Wafer edge damage detection
• Cracked wafer detection
• Foreign wafer fragment detection 

General advantage in any industry

• Robust part inspection at high variation of environmental light